HLDVT'97 Call for Participation

IEEE International High Level Design Validation and Test Workshop

The Claremont Resort & Spa, Oakland, California
Nov. 14-15, 1997

CALL FOR PARTICIPATION

Ascii Version Postscript Version

Sponsored by the IEEE Computer Society Test Technology Technical Committee, and the IEEE Computer Society Design Automation Technical Committee.



The Second IEEE International High Level Design Validation and Test Workshop aims to stimulate research in test and validation methodologies for ICs and systems specified using high level descriptions, where high level refers to register-transfer, behavioral, and system level specifications. The goal of the workshop is to provide an informal forum, bringing together designers and test and verification researchers working in validating, debugging, and testing designs, in an effort to address high level design validation and test issues concurrently. Major topics include, but are not limited to, the following:

High Level Design Validation Hardware/Software Co-Validation
High Level Design Error Modeling High Level DFT/Synthesis for Test
High Level Testbench Generation High Level ATPG/Fault Simulation
Testing Core Based Designs Validation of Microprocessors
Hardware/Software Co-Testing Design Error Debug & Diagnosis

The Program Committee invites authors to submit an extended summary comprising 1000 words describing original, unpublished recent work. Clearly describe the nature of the work, explain its significance, highlight novel features, and describe its current status. On the title page, please indicate: title, name and affiliations of all authors, and suggested topics. Also identify a contact author and include a complete mailing address, phone number, fax number and E-mail address. Panel proposals are also invited. Submit seven copies of proposals by mail or a Postscript version via E-mail. Submissions are due no later than August 1, 1997.

Submit all paper proposals to: For general information, contact:
Sujit Dey, Program Chair Prab Varma, General Chair
NEC USA Duet Technologies Inc.
4 Independence Way 2833 Junction Ave., #100
Princeton, NJ 08540 San Jose, CA 95134
T: 609-951-2973, F: 609-951-2499 T: 408-432-9200, F: 408-432-0907
E-mail:
dey@ccrl.nj.nec.com
E-mail:
prab@duettech.com


Steering Committee:
General Chair: P. Varma, Duet Technologies Inc.
Vice-General Chair: P. Marwedel, Univ. of Dortmund
Program Chair: S. Dey, NEC USA
Finance Chair: A. Orailoglu, UC San Diego
Publicity Chair: M. Fujita, Fujitsu Labs of America
Proceedings Chair: R.Raina, Motorola Inc.
European Liaison: B.Courtois, TIMA
Asian Liaison: H.Yasuura, Kyushu University
Member At Large V.Nagaswamy, VSI
Program Committee:
M.Abadir Motorola
J.Abraham U. Texas
B.Bennetts LogicVision
R.Bergamaschi IBM
S.Bhatia Duet Technologies
F.Brglez NCSU
K.T.Cheng UCSB
R.Gupta UCI
A.Jerraya TIMA
J.Jess U. Eindhoven
R.Gupta UCI
D.Ku Escalade
L.Lavagno P. di Torino/CBL
J.Lu Nat. Semiconductors
J.P. Masbou Intel
E.J.McCluskey Stanford U
C.Papachristou CWRU
C.Pixley Motorola
I.Pomeranz U. Iowa
M.Potkonjak UCLA
J.Rajski Mentor Graphics
W.Rosenstiel Tuebingen U
B.Rouzeyre LIRMM
R.Roy NEC USA
Y.Zorian LogicVision

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